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Demonstrations: Test and Analysis

 

Test and Analysis

May 22nd, Friday, 02:00 pm - 03:30 pm
Session Chair: Ivan Beschastnikh, University of British Columbia
Room: F1b
 

02:00 - 02:10

 

 

 

Milos Gligoric; Lamyaa Eloussi; Darko Marinov

University of Illinois at Urbana-Champaign, USA

     

02:10 - 02:20

 

 

 

Haruto Tanno; Xiaojing Zhang; Hoshino Takashi; Koushik Sen

NTT Laboratories, Japan; University of California at Berkeley, USA

     

02:20 - 02:30

 

 

 

Feifei Chen; John Grundy; Jean-Guy Schneider; Yun Yang; Qiang He

Swinburne University of Technology, Australia

     

02:30 - 02:40

 

 

 

Alireza Sadeghi; Hamid Bagheri; Sam Malek

George Mason University, USA

     

02:40 - 02:50

 

 

 

Christos Tsigkanos; Liliana Pasquale; Carlo Ghezzi; Bashar Nuseibeh

Politecnico di Milano, Italy; Lero, Ireland; The Open University, UK

     

02:50 - 03:00

 

 

 

Benjamin Holland; Tom Deering; Suresh Kothari; Jon Mathews; Nikhil Ranade

Iowa State University, USA; EnSoft Corp., USA

     

03:00 - 03:10

 

 

 

Daniel Schwartz-Narbonne; Chanseok Oh; Martin Schäf; Thomas Wies

New York University, USA; SRI International, USA

     

03:10 - 03:20

 

 

 

Rein Raudjärv; Allan Gregersen

Zeroturnaround, Estonia

     

03:20 - 03:30

 

 

 

Rahul Dixit; Gerald Weber; Christof Lutteroth

University of Auckland, New Zealand

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